ELECTRON MICROSCOPY Experimental Data



EM Sample
Sample Vitrification Details 0 blot force, 3 second blot time, 3 uL sample added to freshly glow-discharged grids
Sample Aggregation State PARTICLE
Sample Reconstruction Method SINGLE PARTICLE
Name of Sample Complex of RC1 variant of BG505 SOSIP.664 trimer with three Ab275MUR Fabs and three 8ANC195 Fabs
EM Data Acquisition
Date of Experiment --
Temperature (Kelvin) --
Microscope Model FEI TALOS ARCTICA
Detector Type FEI FALCON III (4k x 4k)
Minimum Defocus (nm) 800.0
Maximum Defocus (nm) 2500.0
Minimum Tilt Angle (degrees) --
Maximum Tilt Angle (degrees) --
Nominal CS 2.7
Imaging Mode BRIGHT FIELD
Electron Dose (electrons per Å**-2) 40.0
Illumination Mode FLOOD BEAM
Nominal Magnification 73000
Calibrated Magnification --
Source FIELD EMISSION GUN
Acceleration Voltage (kV) 200
Imaging Details --
3D Reconstruction
Software Package(s) cryoSPARC
Reconstruction Method(s) --
EM Image Reconstruction Statistics
Number of Particles 49308
Other Details --
Effective Resolution 4.4
EM Map-Model Fitting and Refinement
Refinement Space Refinement Protocol Refinement Target Overall B Value Fitting Procedure Fitting Software
REAL RIGID BODY FIT Correlation coefficient -- -- --