ELECTRON MICROSCOPY

Refinement

RMS Deviations
KeyRefinement Restraint Deviation
f_dihedral_angle_d10.299
f_angle_d0.833
f_chiral_restr0.114
f_bond_d0.007
f_plane_restr0.005
Sample
Complex of RC1 variant of BG505 SOSIP.664 trimer with three 10-1074 Fabs and three CD4bs Fabs
Sample Components
RC1 variant of BG505 SOSIP.664 trimer
10-1074 Fab
Specimen Preparation
Sample Aggregation StatePARTICLE
Vitrification InstrumentFEI VITROBOT MARK IV
Cryogen NameETHANE
Sample Vitrification Details0 blot force, 3.5 second blot time, 3 uL sample added to freshly glow-discharged grids
3D Reconstruction
Reconstruction MethodSINGLE PARTICLE
Number of Particles122013
Reported Resolution (Å)4.05
Resolution MethodFSC 0.143 CUT-OFF
Other Details
Refinement Type
Symmetry TypePOINT
Point SymmetryC3
Map-Model Fitting and Refinement
Id1 (5T3Z, 5T3Z, 5T3Z, 5T3Z)
Refinement SpaceREAL
Refinement ProtocolRIGID BODY FIT
Refinement TargetCorrelation coefficient
Overall B Value
Fitting Procedure
Details
Data Acquisition
Detector TypeFEI FALCON III (4k x 4k)
Electron Dose (electrons/Å**2)40
Imaging Experiment1
Date of Experiment
Temperature (Kelvin)
Microscope ModelFEI TALOS ARCTICA
Minimum Defocus (nm)1000
Maximum Defocus (nm)3400
Minimum Tilt Angle (degrees)
Maximum Tilt Angle (degrees)
Nominal CS2.7
Imaging ModeBRIGHT FIELD
Specimen Holder ModelFEI TITAN KRIOS AUTOGRID HOLDER
Nominal Magnification73000
Calibrated Magnification
SourceFIELD EMISSION GUN
Acceleration Voltage (kV)200
Imaging Details
EM Software
TaskSoftware PackageVersion
PARTICLE SELECTIONRELION3
IMAGE ACQUISITIONEPU
CTF CORRECTIONGctf1.06
MODEL FITTINGUCSF Chimera
MODEL REFINEMENTPHENIX1.14
INITIAL EULER ASSIGNMENTcryoSPARC2.1
FINAL EULER ASSIGNMENTcryoSPARC2.1
CLASSIFICATIONcryoSPARC2.1
RECONSTRUCTIONcryoSPARC2.1
Image Processing
CTF Correction TypeCTF Correction DetailsNumber of Particles SelectedParticle Selection Details
PHASE FLIPPING AND AMPLITUDE CORRECTION